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phoenix nanome|x

Advanced 2D inspection with optional nanoCT

nanome|x High-Resolution Nanofocus X-Ray Inspection System

The phoenix nanome|x is an ultra high-resolution 180 kV nanofocus X-ray inspection system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries. The system offers excellent performance and versatility and can be optionally used for 2D X-ray inspection as well as for full 3D computed tomography (micro- and nanoCT as well as planarCT). With the phoenix x|act software package the phoenix nanome|x is the system of choice to ensure meeting actual and future zero defect requirements.

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