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The phoenix microme|x is a high-resolution microfocus X-ray inspection system with micro- and planarCT option.

High-resolution microfocus X-ray inspection system

microme|x microfocus X-ray inspection system

The phoenix microme|x is a high-resolution 180 kV microfocus X-ray inspection system for real time inspection of solder joints and electronic components as well as for automated inspection (µAXI). Innovative and unique features and an extreme high positioning accuracy make the system the effective and reliable solution for a wide spectrum of 2D and 3D inspection tasks: R&D, failure analysis, process and quality control as well as automated offline inspection. Optional the system can be equipped with microCT or planarCT.

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